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Design, Implementation, and Evolution of Proficiency Testing in EMC Conducted Immunity
IEEE Transactions on Electromagnetic Compatibility, 59-5, pp. 1433-1440
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| DOI: | 10.1109/TEMC.2017.2682321 |
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Küng,
A.;
Lassila,
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Prieto,
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M.;
Svedova,
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M.;
Hungwe,
F.;
Kang,
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Intercomparison of flatness measurements of an optical flat at apertures of up to 150 mm in diameter
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Metrologia 54 (2017) 85
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Wollensack,
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IEEE Trans. Instrum. Meas. 66-6, pp. 1516-1523
January 2017
ISSN: 2160-0171
Calibration of a LCR-Meter at Arbitrary Phase Angles using a Fully Automated Impedance Simulator
IEEE Trans. Instrum. Meas. 66-6, pp. 1516-1523
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| DOI: | 10.1109/CPEM.2016.7540610 |
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| DOI: | 10.1364/OE.25.016310 |
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January 2017
| DOI: | 10.1364/OE.25.016310 |
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AC Quantum Hall Effect in Epitaxial Graphene
IEEE Trans. Instrum. Meas. 66-6, pp. 1459-1466
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Publisher: IEEE
ISSN: 2160-0171
AC Quantum Hall Effect in Epitaxial Graphene
IEEE Trans. Instrum. Meas. 66-6, pp. 1459-1466
January 2017
Publisher: IEEE
ISSN: 2160-0171
| DOI: | 10.1109/CPEM.2016.7540655 |
| ISBN: | 978-1-4673-9134-4 |
| File: |
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Zeier,
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Hoffmann,
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Ruefenacht,
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Wollensack,
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January 2017
Design of a Reference Device for Radiated Immunity Inter-laboratory Comparison
Proc. of the 2018 International Symposium on Electromagnetic Comptability - EMC EUROPE 2018, Amsterdam, The Netzherland, August 27-30, 2018
January 2017
| DOI: | 10.1109/EMCEurope.2018.8484988 |
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IEEE Transactions on Electromagnetic Compatibility, 59-5, pp. 1433-1440
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IEEE Transactions on Electromagnetic Compatibility, 59-5, pp. 1433-1440
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CPEM 2016
Ottawa, Canada, 10-07-2016 to 15-07-2016
Publisher: IEEE
August 2016
Characterization of HMDS treated CVD Graphene
CPEM 2016
Ottawa, Canada, 10-07-2016 to 15-07-2016
Publisher: IEEE
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April 2016
Publisher: IOP
Broadband fully automated digitally assisted coaxial bridge for high accuracy impedance ratio measurements
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CVD Graphene for Electrical Quantum Metrology
Publisher: IEEE
August 2014
CVD Graphene for Electrical Quantum Metrology
Publisher: IEEE
August 2014
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| ISBN: | 978-1-4799-2479-0 |
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Publisher: IEEE
August 2014
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Publisher: IEEE
August 2014
| DOI: | 10.1109/CPEM.2014.6898341 |
| ISBN: | 978-1-4799-2479-0 |
| File: |