2014
9.
[English]
Overney,
Fr´ed´eric;
Jeanneret,
Blaise
Impedance simulator for automatic calibration of LCR-meters
29th Conference on Precision Electromagnetic Measurements
Rio de Janeiro, Brazil, 24 - 29 August 2014
2014
Impedance simulator for automatic calibration of LCR-meters
29th Conference on Precision Electromagnetic Measurements
Rio de Janeiro, Brazil, 24 - 29 August 2014
2014
| DOI: | 10.1109/CPEM.2014.6898594 |
| File: |
8.
[English]
Nissilä,
J.;
Ojasalo,
K.;
Kampik,
M.;
Kaasalainen,
J.;
Maisi,
V.;
Casserly,
M.;
Overney,
F.;
Christensen,
A.;
Callegaro,
L.;
D'Elia,
V.;
Tran,
N. T. M.;
Pourdanesh,
F.;
Ortolano,
M.;
Kim,
D. B.;
Penttilä,
J.;
Roschier,
L.
A precise two-channel digitally synthesized AC voltage source for impedance metrology
29th Conference on Precision Electromagnetic Measurements
Rio de Janeiro, Brazil, 24 - 29 August 2014
2014
A precise two-channel digitally synthesized AC voltage source for impedance metrology
29th Conference on Precision Electromagnetic Measurements
Rio de Janeiro, Brazil, 24 - 29 August 2014
2014
| File: |
7.
[English]
Palafox,
L.;
Raso,
F.;
Kucera,
J.;
Overney,
F.;
Callegaro,
L.;
Gournay,
P.;
Ziołek,
A.;
Nissilä,
J.;
Eklund,
G.;
Lippert,
T.;
Gülmez,
Y.;
Fleischmann,
P.;
Kampik,
M.;
Rybski,
R.
AIM QuTE: Automated Impedance Metrology extending the Quantum Toolbox for Electricity
16th International Congress of Metrology
Paris, France, 7-10 October 2013
2014
AIM QuTE: Automated Impedance Metrology extending the Quantum Toolbox for Electricity
16th International Congress of Metrology
Paris, France, 7-10 October 2013
2014
| DOI: | 10.1051/metrology/201311001 |
| File: |
6.
[English]
Kohlmann,
J.;
Behr,
R.;
Kieler,
O.;
Diaz de Aguilar Rois,
J.;
Sira,
M.;
Sosso,
A.;
Trinchera,
B.;
Gran,
J.;
Malmbekk,
H.;
Jeanneret,
B.;
Overney,
F.;
Nissilä,
J.;
Lehtonen,
T.;
Ireland,
J.;
Williams,
J.;
Lapuh,
R.;
Voljc,
B.;
Bergsten,
T.;
Eklund,
G.;
Coskun Ozturk,
T.;
Houtzager,
E.;
van den Brom,
H.E.;
Ohlckers,
P.
A quantum standard for sampled electrical measurements - main goals and first results of the EMRP project Q-WAVE
29th Conference on Precision Electromagnetic Measurements
Rio de Janeiro, Brazil, 24 - 29 August 2014
2014
A quantum standard for sampled electrical measurements - main goals and first results of the EMRP project Q-WAVE
29th Conference on Precision Electromagnetic Measurements
Rio de Janeiro, Brazil, 24 - 29 August 2014
2014
| DOI: | 10.1109/CPEM.2014.6898489 |
| File: |
2011
5.
[English]
Jeanneret,
B.;
Ruefenacht,
A.;
Overney,
F.;
van den Brom,
H.;
Houtzager,
E.
High precision comparison between a programmable and a pulse-driven Josephson voltage standard
Metrologia, 48 :311-316
2011
High precision comparison between a programmable and a pulse-driven Josephson voltage standard
Metrologia, 48 :311-316
2011
| DOI: | 10.1088/0026-1394/48/5/011 |
| File: |
2010
4.
[English]
Rufenacht,
A.;
Overney,
F.;
Mortara,
A.;
Jeanneret,
B.
Josephson-voltage-standard-locked sine wave synthesizer: implementation and preliminary results
2010 Conference on Precision Electromagnetic Measurements digest :147-148
2010
Josephson-voltage-standard-locked sine wave synthesizer: implementation and preliminary results
2010 Conference on Precision Electromagnetic Measurements digest :147-148
2010
| File: |
3.
[English]
Jeanneret,
B.;
Overney,
F.;
Rufenacht,
A.;
Nissilä,
J.
Strong Attenuation of the Transients´ Effect in Square Waves Synthesized with a Programmable Josephson Voltage Standard"
IEEE Transactions on Instrumentation and Measurement, 59 (7) :1894-1899
2010
ISSN: 0018-9456
Strong Attenuation of the Transients´ Effect in Square Waves Synthesized with a Programmable Josephson Voltage Standard"
IEEE Transactions on Instrumentation and Measurement, 59 (7) :1894-1899
2010
ISSN: 0018-9456
| File: |
2009
2.
[English]
Jeanneret,
B.;
Overney,
F.;
Callegaro,
L.;
Mortara,
A.;
Rufenacht,
A.
Josephson-Voltage-Standard-Locked Sine Wave Synthesizer: Margin Evaluation and Stability
IEEE Transactions on Instrumentation and Measurement, 58 (4) :791-796
2009
ISSN: 0018-9456
Josephson-Voltage-Standard-Locked Sine Wave Synthesizer: Margin Evaluation and Stability
IEEE Transactions on Instrumentation and Measurement, 58 (4) :791-796
2009
ISSN: 0018-9456
| File: |
1.
[English]
Jeanneret,
B.;
Overney,
F.;
Rufenacht,
A.;
Nissilä,
J.
Transition shape effect in the transients generated by a programmable Josephson voltage standard
2010 Conference on Precision Electromagnetic Measurements (CPEM)
Daejeon, Korea, 13-18 June, 2010
2009
Transition shape effect in the transients generated by a programmable Josephson voltage standard
2010 Conference on Precision Electromagnetic Measurements (CPEM)
Daejeon, Korea, 13-18 June, 2010
2009
| File: |